Title: Dynamic Comparator Noise and Metastability Simulation Techniques

Presenter: 

William Evans, Cadence, USA

Abstract: 

Dynamic or latching comparators are key building blocks used in the design of high speed SAR (Successive Approximation) ADC converters and SerDes (Serializer-Deserializer) receivers. New techniques will be presented on ways to simulate noise in dynamic comparators along with a discussion on simulation pit falls. The topic of comparator metastability will also be covered including simulation techniques and how the simulation results can be related to probability of conversion errors.